Spectrométries de pertes d'énergie des électrons dans les solides = Electron energy loss spectroscopy in solidsTHIRY, Paul A; CAUDANO, Roland; PIREAUX, Jean-Jacques et al.Techniques de l'ingénieur. Analyse et caractérisation. 1995, Vol P4, Num P2635, pp P2635.1-P2635.12, issn 1762-8717Article

Introduction to wavelet applications in surface spectroscopiesCHARLES, Catherine; LECLERC, Gervais; PIREAUX, Jean-Jacques et al.Surface and interface analysis. 2004, Vol 36, Num 1, pp 49-60, issn 0142-2421, 12 p.Article

Plasma functionalization of silicon carbide crystalline nanoparticles in a novel low pressure powder reactorHODY, Hubert; PIREAUX, Jean-Jacques; CHOQUET, Patrick et al.Surface & coatings technology. 2010, Vol 205, Num 1, pp 22-29, issn 0257-8972, 8 p.Article

Time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy analyses of Bixa orellana seedsFELICISSIMO, Marcella P; BITTENCOURT, Carla; HOUSSIAU, Laurent et al.Journal of agricultural and food chemistry (Print). 2004, Vol 52, Num 7, pp 1810-1814, issn 0021-8561, 5 p.Article

HREELS signal processing via waveletsCHARLES, Catherine; LECLERC, Gervais; RASSON, Jean-Paul et al.Surface and interface analysis. 2004, Vol 36, Num 1, pp 61-70, issn 0142-2421, 10 p.Article

Angle-Resolved XPS Study of Plasma-Deposited Polystyrene Films after Oxygen Plasma TreatmentHAÏDOPOULOS, Marie; HORGNIES, Matthieu; MIRABELLA, Frédéric et al.Plasma processes and polymers (Print). 2008, Vol 5, Num 1, pp 67-75, issn 1612-8850, 9 p.Article

Characterization of film failures by bismuth electrodeposition—Application to thin deformed fluorocarbon films for stent applicationsHOLVOET, Servaas; HORNY, Paula; TURGEON, Stephane et al.Electrochimica acta. 2010, Vol 55, Num 3, pp 1042-1050, issn 0013-4686, 9 p.Article

Room-temperature, selective detection of benzene at trace levels using plasma-treated metal-decorated multiwalled carbon nanotubesLEGHRIB, Radouane; FELTEN, Alexandre; DEMOISSON, Fréderic et al.Carbon (New York, NY). 2010, Vol 48, Num 12, pp 3477-3484, issn 0008-6223, 8 p.Article

Finite element analysis of rough surfaces based on ultimate-stress asperity conceptABDO, Jamil.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 858-862, issn 0142-2421, 5 p.Conference Paper

Proceedings European Vacuum Congress, Berlin 2003 (EVC 2003)BENNINGHOVEN, A; PIREAUX, Jean-Jacques; WIESENDANGER, Roland et al.Applied surface science. 2004, Vol 235, Num 1-2, issn 0169-4332, 243 p.Conference Proceedings

Quantitative lateral resolution of a Quantum 2000 X-ray microprobeSCHEITHAUER, U.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 706-709, issn 0142-2421, 4 p.Conference Paper

Vacuum : a void full of questionsPAPARAZZO, Ernesto.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 450-453, issn 0142-2421, 4 p.Conference Paper

Tailoring the porous hierarchy of titanium phosphatesREN, Tie-Zhen; YUAN, Zhong-Yong; AZIOUNE, Ammar et al.Langmuir. 2006, Vol 22, Num 8, pp 3886-3894, issn 0743-7463, 9 p.Article

Noise filtering and deconvolution of XPS data by wavelets and Fourier transformCHARLES, Catherine; LECLERC, Gervais; LOUETTE, Pierre et al.Surface and interface analysis. 2004, Vol 36, Num 1, pp 71-80, issn 0142-2421, 10 p.Article

Papers Presented at ECASIA'07. Proceedings of the 12^th European Conference on Applications of surface and Interface Analysis, 9-14 September 2007, Brussels, BelgiumPIREAUX, Jean-Jacques; WATTS, John F.Surface and interface analysis. 2008, Vol 40, Num 3-4, issn 0142-2421, 782 p.Conference Proceedings

Calculation of layer thickness on rough surfaces by polyhedral modelMOHAI, M.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 710-713, issn 0142-2421, 4 p.Conference Paper

Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin filmsDAPOR, Maurizio.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 714-717, issn 0142-2421, 4 p.Conference Paper

The influence of molybdenum and silicon on activity of Ni + W composite coatings in the hydrogen evolution reactionPOPCZYK, Magdalena.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 246-249, issn 0142-2421, 4 p.Conference Paper

Quantification of surface excitation effects on the EPES-determined IMFPs for GaN and SiCKRAWCZYK, Miroslaw.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 725-727, issn 0142-2421, 3 p.Conference Paper

Friction studies on surface grinding of granite with a vitrified CBN wheelXIPENG XU; CUNJI DU.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 863-866, issn 0142-2421, 4 p.Conference Paper

A novel ATR-FTIR method for functionalised surface characterisationANDERSSON, Per Ola; LIND, Per; MATTSSON, Andreas et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 623-626, issn 0142-2421, 4 p.Conference Paper

Behaviour of T16A14V implant alloy in vitro after plastic deformation by bendingKIERZKOWSKA, Agnieszka; KRASICKA-CYDZIK, Elzbieta.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 507-512, issn 0142-2421, 6 p.Conference Paper

Influence of different primary ion species on the secondary ion emission from PNA/DNA biosensor surfacesHELLWEG, Sebastian; HEILE, Andreas; GREHL, Thomas et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 198-201, issn 0142-2421, 4 p.Conference Paper

Optical trigger based on the molecules of bacteriorhodopsin adsorbed on AgBr nanocrystalsZAKHAROV, V. N; KUDRYAVTSEV, I. K; ASLANOV, L. A et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 495-497, issn 0142-2421, 3 p.Conference Paper

Plasmon peak inhomogeneous broadening in reflection electron energy loss spectroscopy from carbon materialsCALLIARI, L; FANCHENKO, S; FILIPPI, M et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 814-817, issn 0142-2421, 4 p.Conference Paper